The image below is a “stud diode” that had failed shorted.
The diode was chemically decapsulated and the device die was examined in the SEM. A breakdown site was found near one corner of the die.
Below is a higher magnification image of the breakdown site…
… which shows a striking resemblance to the “Face on Mars”.
Conclusion – the short was caused by an alien intelligence far greater than ours.
Check out SEM Lab, Inc. to learn more.