EOS damage on VDD

Posted on September 15, 2014October 3, 2017 by Ed Hare PhD

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EOS fused bond wire

Posted on September 10, 2014October 3, 2017 by Ed Hare PhD

EOS failure resulted in fused bond wire.

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Marking on transistor die

Posted on September 9, 2014January 17, 2019 by Ed Hare PhD

This was an interesting die marking on a transistor die that appears to be over the top of active signal runs. This occasionally results in unintended electrical performance issues.

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Welded relay contact

Posted on September 8, 2014October 3, 2017 by Ed Hare PhD

Welded relay contact.

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Inner Layer Separation

Posted on September 5, 2014October 3, 2017 by Ed Hare PhD

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Bond cratering microsection

Posted on September 4, 2014October 3, 2017 by Ed Hare PhD

Microsection of cratered gold ball bond on silicon die.

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MLCC dielectric porosity

Posted on September 3, 2014October 3, 2017 by Ed Hare PhD

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Diode EOS

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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MLCC flaws

Posted on September 2, 2014June 19, 2019 by Ed Hare PhD

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Parylene coating

Posted on September 2, 2014October 3, 2017 by Ed Hare PhD

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