SEM Lab, Inc.

Providing Failure Analysis Since 1997

SEM Lab, Inc. was founded in 1997 to provide scanning electron microscopy, failure analysis, materials analysis, FTIR services, and forensic engineering for the electronics industry. This has grown to include the medical and aerospace industries as well as other branches of science.

We currently have over 400 client companies including many of the most prominent electronic and high technology companies in the US. And while SEM Lab, Inc. supports many large manufacturers, we also support small and medium sized manufacturers that may not have capabilities internally to perform failure analysis and materials characterization.  We draw on over three decades of failure analysis and materials characterization experience with an emphasis on electronic materials and processes, electronic components, printed wiring boards, printed wiring assemblies, and more.  We perform root cause failure analysis and can provide suggestions for corrective actions based on analysis results and past experience with the same issue.

For current examples of our work visit our SEM Lab, Inc. blog page.  Here you will find many of the common problems encountered in industry.  A search engine on this page can help you locate any item on our website.  

Our principal engineer is Edward Hare, PhD.  His resume is available here, as well as papers and presentations.

The engineers at SEM Lab, Inc. have over 30 years experience in electronics and failure analysis, and would gladly discuss your material or electronic component problems with you.

SEM image of a ceramic sample.
SEM image of a ceramic sample.

Particle residue found on contact region in dissected relay device.

Nickel barrier layer on soldered MLCC termination

Metallographic section of crimped connector pin.