Failure Analysis and Scanning Electron Microscopy

Call To Action

Call To Action

Failure Analysis and Scanning Electron Microscopy Services

LEARN MORE

  Call or text 425.335.4400      Email  

  • SEM Lab, Inc.
  • Services
    • Failure Analysis
    • Electronic Component Failure Analysis
      • F/A of Capacitors
        • Film Capacitors
      • F/A of Resistors
        • Chip Resistor Corrosion
      • F/A of Inductors
      • F/A of Diodes
      • F/A of Transformers
      • F/A of LEDs
      • F/A of ICs
      • F/A of PWBs
      • F/A of BGAs
      • F/A of PCBAs
      • F/A of Medical Devices
      • Identifying Counterfeit Parts
      • PWB Construction Analysis
    • Materials Analysis
      • Solder Joint Analysis
        • Modeling BGA Solder Joints
        • BGA Assembly Verification
        • EDS Data from Sn-Pb Standards
        • Lead Free Solder Analysis
      • Particle Analysis
      • Fiber Analysis
    • FTIR Analysis
      • FTIR of Plastic Parts
    • Scanning Electron Microscopy
    • Microscopy
    • EDS Analysis
      • Thin Film Thickness Measurements
      • EDS Analysis of Polymers
      • EDS Analysis of Alloy Plating
    • Plating Thickness Measurements
    • Quality Control
      • ENIG Quality Control
  • Examples
    • Devices
    • Materials
    • Cross Sections
    • Miscellaneous
  • Request for Quote
  • Papers
    • Intermetallics in Solder Joints
    • Failure Analysis of BGAs
    • Failure Analysis of LEDs
    • Gold Embrittlement of Solder Joints
    • Failure Analysis of PCBAs
    • Diffusion Barrier Plating in Electronics
    • FTIR Analysis
    • Images of Failures in Microelectronics Packaging
    • Failure Analysis of Aluminum Electrolytic Capacitors
    • Solder Joint Analysis
    • BGA Assembly Verification
    • HASL Finish on PWBs
    • PWB Failure Analysis
    • Solder Flux Residue – Part 1
    • Solder Flux Residue – Part 2
  • Consulting
  • Blog
  • Contact Us

Particles in Relay Device

Particle residue found on contact region in dissected relay device.

Particle residue found on contact region in dissected relay device.

Leave a comment

Contact Info

© 2025 SEM Lab Inc. | Privacy Statement | 425-335-4400 | info@semlab.com