Migration

Dendritic Electromigration

A classic Sn-Pb dendritic growth image that works especially well for teaching the difference between electrically meaningful conductive growth and incidental residue.

Scale 1704X
Observed feature Classic tin-lead dendritic growth associated with electromigration
Likely mechanism Sn-Pb electromigration causing conductive growth between adjacent signals
Dendritic electromigration example

Interpretation

Why this image matters

The dendritic morphology is visually clear, which makes the image useful for training engineers to recognize conductive growth rather than treating all surface residue as equivalent.

The report context confirmed Sn-Pb electromigration between several pins and also noted associated corrosion product with chlorine and bromine, supporting a contamination-enabled migration mechanism.

That makes this image especially useful for explaining how contamination, leakage, corrosion product, and eventual shorting can fit into the same progression.

electromigration dendrites sn-pb shorting
Use this when

Best comparison value

  • Teaching contamination-assisted leakage progression
  • Comparing dendrites with harmless residue
  • Discussing migration-driven shorting between signals