Failure Analysis and Scanning Electron Microscopy
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SEM Lab, Inc.
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Failure Analysis
Electronic Component Failure Analysis
F/A of Capacitors
Film Capacitors
F/A of Resistors
Chip Resistor Corrosion
F/A of Inductors
F/A of Diodes
F/A of Transformers
F/A of LEDs
F/A of ICs
F/A of PWBs
F/A of BGAs
F/A of PCBAs
F/A of Medical Devices
Identifying Counterfeit Parts
PWB Construction Analysis
Materials Analysis
Solder Joint Analysis
BGA Assembly Verification
EDS Data from Sn-Pb Standards
Lead Free Solder Analysis
Particle Analysis
Fiber Analysis
EDS Analysis
Thin Film Thickness Measurements
EDS Analysis of Polymers
EDS Analysis of Alloy Plating
FTIR Analysis
FTIR of Plastic Parts
Scanning Electron Microscopy
X-Ray Inspection
Microscopy
Quality Control
ENIG Quality Control
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Intermetallics in Solder Joints
Failure Analysis of BGAs
Failure Analysis of LEDs
Gold Embrittlement of Solder Joints
Failure Analysis of PCBAs
Diffusion Barrier Plating in Electronics
FTIR Analysis
Images of Failures in Microelectronics Packaging
Failure Analysis of Aluminum Electrolytic Capacitors
Solder Joint Analysis
BGA Assembly Verification
HASL Finish on PWBs
PWB Failure Analysis
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EDS Data from Sn-Pb Standards
SOLDER JOINT ANALYSIS
