Public evidence metadata ยท SEM-EVIDENCE-0017

Solder Flux Residue - Part 2

This paper extends the solder-flux-residue topic by examining how to interpret EDS data when the electron beam can penetrate thin residue layers and include contribution from the solder mask underneath. The source page specifically frames the paper around removing that solder-mask contribution from the analysis. That makes Part 2 a useful companion to Part 1 rather than a repeat. It is focused more narrowly on how to interpret the data correctly when residue is present on a PCBA surface.

Evidence coverage

Failure modes

contaminationanalytical interference

Materials

solder flux residuesolder mask

Analytical methods

SEMEDSbackground correction