
Case 1516 ยท Public preview
Cracked Glass Seals Can Initiate Breakdown Outside a Protection Diode
Potted transient-voltage-suppression modules developed localized burn and melt sites during accelerated testing.
Controlled decapsulationOptical microscopySEMEDSProgressive microsectioning

What the evidence preview establishes
Electrical breakdown occurred outside the diode bodies at the potting-to-glass-seal interfaces. Cracked diode seals were the most significant fabrication anomaly and likely promoted the failures.
Why this case matters
When a potted protection module arcs, trace the damage path backward rather than treating every melted phase as causal. Seal cracks can retain contaminants and create a vulnerable external interface even when the diode die survives.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.