Case 1775 ยท Public preview
Surge Current Can Produce Interfacial Breakdown in Solid Tantalum Capacitors
A solid tantalum capacitor failed short with approximately 0.6-ohm terminal resistance.
Electrical testingOptical microscopyMicrosectioningSEMEDSApplication review
What the evidence preview establishes
A hemispherical primary breakdown site originated near the MnO2 and tantalum-slug interface, a morphology consistent with surge-current heating. Operating voltage above recommended derating likely increased susceptibility; no general fabrication defect explained the failure.
Why this case matters
Not every workmanship anomaly near a failed component is causal. Failure-site geometry, electrical history, voltage derating, and the spatial relationship of observed defects should determine which evidence carries the most weight.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.