Case 944 ยท Public preview
Foreign Dielectric Inclusions Can Create MLCC Leakage Without a Crack
A multilayer ceramic capacitor was reported shorted, and the in-circuit resistance was a stable 3,067 ohms rather than the value measured across a known-good assembly.
In-circuit resistance measurementAs-mounted SEM examinationMulti-plane microsectioningBackscattered-electron SEMEDS
What the evidence preview establishes
The capacitor most likely had excessive leakage as manufactured because large zinc-rich inclusions contaminated the titanium-neodymium-oxide dielectric. Some inclusions were large enough to bridge a substantial fraction of the spacing between opposing silver plates.
Why this case matters
Do not stop after ruling out the familiar MLCC crack. Use multiple section planes and localized chemistry to identify foreign inclusions, then compare their size and position with the active dielectric spacing.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, four interpreted figures, alternative explanations, limitations, and practical application guidance.