As-Fabricated Porosity Can Nearly Bridge the Electrode Spacing in an MLCC

What the evidence preview establishes

Excessive porosity in the as-fabricated dielectric was the most likely cause of failure. The capacitor structure also contained irregular electrodes and dielectric layers, a magnesium-depleted interfacial layer, and possible plate-to-dielectric adhesion defects.

Why this case matters

For an electrically failed MLCC without a classic bending crack, examine dielectric quality throughout several section planes. Aligned pores, large voids, and irregular electrode spacing can sharply reduce the effective insulation path even when the external solder joints appear sound.