Case 1599 ยท Public preview
Similar Failed LEDs Can Have Two Different Damage Mechanisms
Four failed LEDs showed different electrical behaviors: two were shorted or had abnormally low forward voltage, while two were open or high resistance.
Electrical comparisonDecapsulationOptical microscopySEMCross-sectioning
What the evidence preview establishes
The evidence supports two distinct failure paths. A melt-pipe feature in one low-forward-voltage LED supports ESD damage, while lens-to-cup and die-attach separation in an open LED supports thermal overstress. The same mechanism was not directly demonstrated in every member of either electrical group.
Why this case matters
Sort failed LEDs by electrical behavior before generalizing a mechanism. Correlate a short or depressed forward voltage with localized die damage, and an open or high-resistance condition with bond, die-attach, and package-interface integrity.
Full evidence reserved for MEMBER and STOREThe complete case includes the evidence sequence, 4 interpreted figures, alternative explanations, limitations, and practical application guidance.