Residual Chloride Can Turn Surface Leakage into Catastrophic Arc Damage

What the evidence preview establishes

Chloride-bearing flux residue promoted electrochemical migration of tin and lead compounds between oppositely biased connector lands. The resulting conductive path supported leakage and eventually arc-over, producing severe secondary thermal damage.

Why this case matters

Treat flux residues as an electrochemical system, not merely a cosmetic condition. Correlate ionic species, moisture, voltage gradients, spacing, migration deposits, and clean controls before attributing catastrophic damage to the burned component nearest the arc site.