Optical Microscopy and Microphotography
First Step in Failure Analysis
Optical microscopy is often used as the first step in doing failure analysis or materials characterization. At SEM Lab, Inc. our optical microscopes can provide up to 400X magnification and darkfield/brightfield imaging, which can document part markings and any external damage that might be present.
Optical image of a decapsulated EEPROM.
Flux residue on solder joints.
LED failure due to an open bond wire.
Shown here are examples of some optical images which were then used to further examine failure sites or sites of interest. Often subsequent testing is destructive so it is good to have this initial visual documentation.