Transistor failure caused by electrical overstress damage across most of the emitter region of the die.
- Home
- Services
-
Papers
- Intermetallics in Solder Joints
- Failure Analysis of BGAs
- FAILURE ANALYSIS OF LEDS
- GOLD EMBRITTLEMENT OF SOLDER JOINTS
- FAILURE ANALYSIS OF PCBAS
- DIFFUSION BARRIER PLATING IN ELECTRONICS
- IMAGES OF FAILURES IN MICROELECTRONIC PACKAGING
- FOURIER TRANSFORM INFRARED (FTIR) ANALYSIS
- Failure Analysis of Aluminum Electrolytic Capacitors
- Examples
- Contact
Services
Search this site:
Site Map |
Contact Us |
Corporate Info |
Privacy
Notice
Copyright © 1997 - 2013 SEM Lab, Inc. All rights Reserved.