In addition to Scanning Electron Microscopy (SEM) analysis and optical microscopy, SEM Lab, Inc. uses Energy Dispersive X-ray (EDX or EDS) analysis in conjunction with Fourier Transform Infrared Spectroscopy (FTIR) analysis to identify and characterize materials. More details about these services can be found here:

SEM Lab, Inc. specializes in electronic materials and process characterization such as plating thickness and metallurgical evaluation, microstructural characterization, particle composition and shape characterization. We can provide expert materials support for electronic design and development, first article inspection, and lot-to-lot quality evaluations.