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Failure Analysis and Scanning Electron Microscopy

SEM Lab, Inc. provides failure analysis, materials characterization, scanning electron microscopy (SEM) and FTIR services. We specialize in failure analysis of electronic assemblies, printed-circuit-boards (PCBs) or printed-wiring-boards (PWBs), and electronic components such as integrated circuits (ICs), memory chips, transistors, diodes, capacitors, resistors, light emitting diodes (LEDs), power modules, and many others.

Since 1997 we have developed relationships with over 200 client companies including many of the most prominent Fortune 500 electronic, medical and high technology companies in the US and Canada.

Failure Analysis

  • Metallurgical failure analysis
  • Corrosion problems
  • Structural failure analysis
  • Fracture analysis

Electronic Component Failure Analysis

  • Device and component failures
  • Electronic assembly analysis
  • Component failure mechanisms
  • PWB construction analysis

Materials Analysis

  • Characterization and analysis of materials (metals, plastics, ceramics, glasses)
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • Particle analysis and identification
  • Metallurgical evaluation
  • Microstructural characterization

SEM/EDS Analysis

  • Zoom magnification up to 50,000X
  • Elemental analysis of C (z=6) to U (z=92)


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