Failure Analysis and Scanning Electron Microscopy
SEM Lab, Inc. provides failure analysis,
materials characterization, scanning electron microscopy (SEM)
and FTIR services. We specialize in failure analysis of
electronic assemblies, printed-circuit-boards (PCBs) or
printed-wiring-boards (PWBs), and electronic components such as
integrated circuits (ICs), memory chips, transistors, diodes,
capacitors, resistors, light emitting diodes (LEDs), power modules, and many others.
Since 1997 we have developed relationships with over 200 client
companies including many of the most prominent Fortune 500
electronic, medical and high technology companies in the US and
Canada.
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